Correlation and characterisation of individual glass shards from tephra deposits using trace element laser ablation ICP‐MS analyses: current status and future potential
Identifieur interne : 000140 ( Main/Exploration ); précédent : 000139; suivant : 000141Correlation and characterisation of individual glass shards from tephra deposits using trace element laser ablation ICP‐MS analyses: current status and future potential
Auteurs : Nicholas J. G. Pearce [Royaume-Uni] ; Joanna S. Denton [Royaume-Uni] ; William T. Perkins [Royaume-Uni] ; John A. Westgate [Canada] ; Brent V. Alloway [Nouvelle-Zélande]Source :
- Journal of Quaternary Science [ 0267-8179 ] ; 2007-10.
Descripteurs français
- Wicri :
English descriptors
- KwdEn :
- Aberystwyth, Ablation, Ablation craters, Ablation process, Alloway, Analytical chemistry, Analytical precision, Anhydrous basis, Aniakchak, Auckland, Auckland region, Calibration strategies, Colourless, Colourless glasses, Colourless materials, Copyright, Correlative, Count rates, Count ratio, Count ratios, Crater, Crow tephra, Deposit, Detection limits, Earth sciences, Eastern mediterranean, Eastwood, Element fractionation, Elemental fractionation, Eruption, Excimer laser, Fractionation, Fresenius journal, Geological society, Geostandards newsletter, Geothermal research, Glass shard analysis, Glass shard trace element laser ablation analyses, Glass shards, Golhisar golu, Gunther, Individual deposits, Individual glass shards, Individual shards, Inductively, Interface region, Isotope, John wiley sons, Laser, Laser ablation, Laser ablation inductively, Laser energy, Laser system, Lower limits, Magnetic sector, Magnetic sector instrument, Magnetic sector instruments, Major element analyses, Major element composition, Mass spectrometer, Microprobe, Minoan, Minoan eruption, Nist, Nist glass, Nist glasses, Ongatiti, Ongatiti correlatives, Pearce, Perkins, Place constraints, Plasma mass spectrometry, Plasmaquad, Plasmaquad pqii, Pqii, Probe analyses, Probe analysis, Quaternary, Quaternary science, Recent years, Rhyolitic, Rhyolitic glasses, Santorini, Shard, Silicic, Similar approach, Single glass shards, Single grain, Size range, Smaller glass shards, Spectrometer, Spectrometer vacuum, Spectrometry, Spectron systems laser, Tephra, Tephra deposits, Tephra studies, Tephras, Terrestrial tephra deposits, Thermo, Thermo finnigan element, Trace element, Trace element analyses, Trace element analysis, Trace element chemistry, Trace element composition, Trace element data, Trace element ratios, Trace elements, Usgs, Volcanic, Volcanic glass, Volcanic glass shards, Volcanism, Waiuku, Westgate, Yellowstone.
- Teeft :
- Aberystwyth, Ablation, Ablation craters, Ablation process, Alloway, Analytical chemistry, Analytical precision, Anhydrous basis, Aniakchak, Auckland, Auckland region, Calibration strategies, Colourless, Colourless glasses, Colourless materials, Copyright, Correlative, Count rates, Count ratio, Count ratios, Crater, Crow tephra, Deposit, Detection limits, Earth sciences, Eastern mediterranean, Eastwood, Element fractionation, Elemental fractionation, Eruption, Excimer laser, Fractionation, Fresenius journal, Geological society, Geostandards newsletter, Geothermal research, Glass shard analysis, Glass shard trace element laser ablation analyses, Glass shards, Golhisar golu, Gunther, Individual deposits, Individual glass shards, Individual shards, Inductively, Interface region, Isotope, John wiley sons, Laser, Laser ablation, Laser ablation inductively, Laser energy, Laser system, Lower limits, Magnetic sector, Magnetic sector instrument, Magnetic sector instruments, Major element analyses, Major element composition, Mass spectrometer, Microprobe, Minoan, Minoan eruption, Nist, Nist glass, Nist glasses, Ongatiti, Ongatiti correlatives, Pearce, Perkins, Place constraints, Plasma mass spectrometry, Plasmaquad, Plasmaquad pqii, Pqii, Probe analyses, Probe analysis, Quaternary, Quaternary science, Recent years, Rhyolitic, Rhyolitic glasses, Santorini, Shard, Silicic, Similar approach, Single glass shards, Single grain, Size range, Smaller glass shards, Spectrometer, Spectrometer vacuum, Spectrometry, Spectron systems laser, Tephra, Tephra deposits, Tephra studies, Tephras, Terrestrial tephra deposits, Thermo, Thermo finnigan element, Trace element, Trace element analyses, Trace element analysis, Trace element chemistry, Trace element composition, Trace element data, Trace element ratios, Trace elements, Usgs, Volcanic, Volcanic glass, Volcanic glass shards, Volcanism, Waiuku, Westgate, Yellowstone.
Abstract
Laser ablation inductively coupled plasma mass spectrometry (LA‐ICP‐MS) is a high spatial resolution analytical method which has been applied to the analysis of silicic tephras. With current instrumentation, around 30 trace elements can be determined from single glass shards as small as ∼ 40 µm, separated from tephra deposits. As a result of element fractionation during the ablation process using a 266 nm laser, a relatively complex calibration strategy is required. Nonetheless, such a strategy gives analyses which are accurate (typically within ±5%) and have an analytical precision which varies from ∼ ±2% at 100 ppm, to ∼ ±15% at 1 ppm. Detection limits for elements used in correlation and discrimination studies are well below 1 ppm. Examples of the application of trace element analysis by LA‐ICP‐MS in tephra studies are presented from the USA, New Zealand and the Mediterranean. Improvements in instrumental sensitivity in recent years have the potential to lower detection limits and improve analytical precision, thus allowing the analysis of smaller glass shards from more distal tephras. Laser systems operating at shorter wavelengths (e.g. 193 nm) are now more widely available, and produce a much more controllable ablation in glasses than 266 nm lasers. Crater sizes of <10 µm are easily achieved, and at 193 nm many of the elemental fractionation issues which mar longer wavelengths are overcome. By coupling a short wavelength laser to a modern ICP‐MS it should be possible to determine the trace element composition of glass shards as small as 20 µm and, providing sample preparation issues can be overcome, the determination of the more abundant trace elements in glass shards as small as 10 µm is within instrumental capabilities. This will make it possible to chemically fingerprint tephra deposits which are far from their sources, and will greatly extend the range over which geochemical correlation of tephras can be undertaken. Copyright © 2007 John Wiley & Sons, Ltd.
Url:
DOI: 10.1002/jqs.1092
Affiliations:
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type="ISSN">0267-8179</idno></seriesStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Aberystwyth</term><term>Ablation</term><term>Ablation craters</term><term>Ablation process</term><term>Alloway</term><term>Analytical chemistry</term><term>Analytical precision</term><term>Anhydrous basis</term><term>Aniakchak</term><term>Auckland</term><term>Auckland region</term><term>Calibration strategies</term><term>Colourless</term><term>Colourless glasses</term><term>Colourless materials</term><term>Copyright</term><term>Correlative</term><term>Count rates</term><term>Count ratio</term><term>Count ratios</term><term>Crater</term><term>Crow tephra</term><term>Deposit</term><term>Detection limits</term><term>Earth sciences</term><term>Eastern mediterranean</term><term>Eastwood</term><term>Element fractionation</term><term>Elemental fractionation</term><term>Eruption</term><term>Excimer laser</term><term>Fractionation</term><term>Fresenius journal</term><term>Geological society</term><term>Geostandards newsletter</term><term>Geothermal research</term><term>Glass shard analysis</term><term>Glass shard trace element laser ablation analyses</term><term>Glass shards</term><term>Golhisar golu</term><term>Gunther</term><term>Individual deposits</term><term>Individual glass shards</term><term>Individual shards</term><term>Inductively</term><term>Interface region</term><term>Isotope</term><term>John wiley sons</term><term>Laser</term><term>Laser ablation</term><term>Laser ablation inductively</term><term>Laser energy</term><term>Laser system</term><term>Lower limits</term><term>Magnetic sector</term><term>Magnetic sector instrument</term><term>Magnetic sector instruments</term><term>Major element analyses</term><term>Major element composition</term><term>Mass spectrometer</term><term>Microprobe</term><term>Minoan</term><term>Minoan eruption</term><term>Nist</term><term>Nist glass</term><term>Nist glasses</term><term>Ongatiti</term><term>Ongatiti correlatives</term><term>Pearce</term><term>Perkins</term><term>Place constraints</term><term>Plasma mass spectrometry</term><term>Plasmaquad</term><term>Plasmaquad pqii</term><term>Pqii</term><term>Probe analyses</term><term>Probe analysis</term><term>Quaternary</term><term>Quaternary science</term><term>Recent years</term><term>Rhyolitic</term><term>Rhyolitic glasses</term><term>Santorini</term><term>Shard</term><term>Silicic</term><term>Similar approach</term><term>Single glass shards</term><term>Single grain</term><term>Size range</term><term>Smaller glass shards</term><term>Spectrometer</term><term>Spectrometer vacuum</term><term>Spectrometry</term><term>Spectron systems laser</term><term>Tephra</term><term>Tephra deposits</term><term>Tephra studies</term><term>Tephras</term><term>Terrestrial tephra deposits</term><term>Thermo</term><term>Thermo finnigan element</term><term>Trace element</term><term>Trace element analyses</term><term>Trace element analysis</term><term>Trace element chemistry</term><term>Trace element composition</term><term>Trace element data</term><term>Trace element ratios</term><term>Trace elements</term><term>Usgs</term><term>Volcanic</term><term>Volcanic glass</term><term>Volcanic glass shards</term><term>Volcanism</term><term>Waiuku</term><term>Westgate</term><term>Yellowstone</term></keywords><keywords scheme="Teeft" xml:lang="en"><term>Aberystwyth</term><term>Ablation</term><term>Ablation craters</term><term>Ablation process</term><term>Alloway</term><term>Analytical chemistry</term><term>Analytical precision</term><term>Anhydrous basis</term><term>Aniakchak</term><term>Auckland</term><term>Auckland region</term><term>Calibration strategies</term><term>Colourless</term><term>Colourless glasses</term><term>Colourless materials</term><term>Copyright</term><term>Correlative</term><term>Count rates</term><term>Count ratio</term><term>Count ratios</term><term>Crater</term><term>Crow tephra</term><term>Deposit</term><term>Detection limits</term><term>Earth sciences</term><term>Eastern mediterranean</term><term>Eastwood</term><term>Element fractionation</term><term>Elemental fractionation</term><term>Eruption</term><term>Excimer laser</term><term>Fractionation</term><term>Fresenius journal</term><term>Geological society</term><term>Geostandards newsletter</term><term>Geothermal research</term><term>Glass shard analysis</term><term>Glass shard trace element laser ablation analyses</term><term>Glass shards</term><term>Golhisar golu</term><term>Gunther</term><term>Individual deposits</term><term>Individual glass shards</term><term>Individual shards</term><term>Inductively</term><term>Interface region</term><term>Isotope</term><term>John wiley sons</term><term>Laser</term><term>Laser ablation</term><term>Laser ablation inductively</term><term>Laser energy</term><term>Laser system</term><term>Lower limits</term><term>Magnetic sector</term><term>Magnetic sector instrument</term><term>Magnetic sector instruments</term><term>Major element analyses</term><term>Major element composition</term><term>Mass spectrometer</term><term>Microprobe</term><term>Minoan</term><term>Minoan eruption</term><term>Nist</term><term>Nist glass</term><term>Nist glasses</term><term>Ongatiti</term><term>Ongatiti correlatives</term><term>Pearce</term><term>Perkins</term><term>Place constraints</term><term>Plasma mass spectrometry</term><term>Plasmaquad</term><term>Plasmaquad pqii</term><term>Pqii</term><term>Probe analyses</term><term>Probe analysis</term><term>Quaternary</term><term>Quaternary science</term><term>Recent years</term><term>Rhyolitic</term><term>Rhyolitic glasses</term><term>Santorini</term><term>Shard</term><term>Silicic</term><term>Similar approach</term><term>Single glass shards</term><term>Single grain</term><term>Size range</term><term>Smaller glass shards</term><term>Spectrometer</term><term>Spectrometer vacuum</term><term>Spectrometry</term><term>Spectron systems laser</term><term>Tephra</term><term>Tephra deposits</term><term>Tephra studies</term><term>Tephras</term><term>Terrestrial tephra deposits</term><term>Thermo</term><term>Thermo finnigan element</term><term>Trace element</term><term>Trace element analyses</term><term>Trace element analysis</term><term>Trace element chemistry</term><term>Trace element composition</term><term>Trace element data</term><term>Trace element ratios</term><term>Trace elements</term><term>Usgs</term><term>Volcanic</term><term>Volcanic glass</term><term>Volcanic glass shards</term><term>Volcanism</term><term>Waiuku</term><term>Westgate</term><term>Yellowstone</term></keywords><keywords scheme="Wicri" type="topic" xml:lang="fr"><term>Chimie analytique</term><term>Droit d'auteur</term><term>Sciences de la terre</term><term>Spectrométrie</term><term>Oligoélément</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">Laser ablation inductively coupled plasma mass spectrometry (LA‐ICP‐MS) is a high spatial resolution analytical method which has been applied to the analysis of silicic tephras. With current instrumentation, around 30 trace elements can be determined from single glass shards as small as ∼ 40 µm, separated from tephra deposits. As a result of element fractionation during the ablation process using a 266 nm laser, a relatively complex calibration strategy is required. Nonetheless, such a strategy gives analyses which are accurate (typically within ±5%) and have an analytical precision which varies from ∼ ±2% at 100 ppm, to ∼ ±15% at 1 ppm. Detection limits for elements used in correlation and discrimination studies are well below 1 ppm. Examples of the application of trace element analysis by LA‐ICP‐MS in tephra studies are presented from the USA, New Zealand and the Mediterranean. Improvements in instrumental sensitivity in recent years have the potential to lower detection limits and improve analytical precision, thus allowing the analysis of smaller glass shards from more distal tephras. Laser systems operating at shorter wavelengths (e.g. 193 nm) are now more widely available, and produce a much more controllable ablation in glasses than 266 nm lasers. Crater sizes of <10 µm are easily achieved, and at 193 nm many of the elemental fractionation issues which mar longer wavelengths are overcome. By coupling a short wavelength laser to a modern ICP‐MS it should be possible to determine the trace element composition of glass shards as small as 20 µm and, providing sample preparation issues can be overcome, the determination of the more abundant trace elements in glass shards as small as 10 µm is within instrumental capabilities. This will make it possible to chemically fingerprint tephra deposits which are far from their sources, and will greatly extend the range over which geochemical correlation of tephras can be undertaken. Copyright © 2007 John Wiley & Sons, Ltd.</div></front></TEI><affiliations><list><country><li>Canada</li><li>Nouvelle-Zélande</li><li>Royaume-Uni</li></country><region><li>Ontario</li></region><settlement><li>Toronto</li></settlement><orgName><li>Université de Toronto</li></orgName></list><tree><country name="Royaume-Uni"><noRegion><name sortKey="Pearce, Nicholas J G" sort="Pearce, Nicholas J G" uniqKey="Pearce N" first="Nicholas J. G." last="Pearce">Nicholas J. G. Pearce</name></noRegion><name sortKey="Denton, Joanna S" sort="Denton, Joanna S" uniqKey="Denton J" first="Joanna S." last="Denton">Joanna S. Denton</name><name sortKey="Pearce, Nicholas J G" sort="Pearce, Nicholas J G" uniqKey="Pearce N" first="Nicholas J. G." last="Pearce">Nicholas J. G. Pearce</name><name sortKey="Perkins, William T" sort="Perkins, William T" uniqKey="Perkins W" first="William T." last="Perkins">William T. Perkins</name></country><country name="Canada"><region name="Ontario"><name sortKey="Westgate, John A" sort="Westgate, John A" uniqKey="Westgate J" first="John A." last="Westgate">John A. Westgate</name></region></country><country name="Nouvelle-Zélande"><noRegion><name sortKey="Alloway, Brent V" sort="Alloway, Brent V" uniqKey="Alloway B" first="Brent V." last="Alloway">Brent V. Alloway</name></noRegion></country></tree></affiliations></record>Pour manipuler ce document sous Unix (Dilib)
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